Multi-Wafer Surface Ion Traps: Enhanced Trap Depth, Vertical Confinement, and Ion Lifetime Through Increased Wafer Separation. Annual Methodological Archive Research Review, [S. l.], v. 4, n. 2, p. 1–31, 2026. DOI: 10.66021/. Disponível em: https://www.amresearchjournal.com/index.php/Journal/article/view/1921. Acesso em: 18 oct. 2026.